ARTICLE
31 January 2018
Research on EMI Noise Measurement Technology Based on Wavelet Analysis
Xu Li
© 2018 by the Authors. Licensee Whioce Publishing, Singapore. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution 4.0 International License ( https://creativecommons.org/licenses/by/4.0/ )
Abstract
Aiming at the problem that it is difficult to measure the electromagnetic radiation produced by the equipment at present, this paper presents a method for measuring the noise of electromagnetic interference (EMI) based on wavelet analysis. The technique uses time frequency localization features of the wavelet transform, based on threshold function filtering method to filter the test signal, which makes it possible in open space or noisy environment for measurement of electromagnetic interference  of  equipment. Simulation  and experimental results show that the technique is able to eliminate or attenuate the noise in the frequency band of 30Hz~1000MHz.
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